Kelemen, M.T. ; Rinner, F. ; Rogg, J. ; Wiedmann, N. ; Kiefer, R. ; Walther, M. ; Mikulla, M. ; Weimann, G.
出版情報:
Test and measurement applications of optoelectronic devices : 21-22 January 2002, San Jose, USA. pp.75-81, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Rinner, F. ; Rogg, J. ; Wiedmann, N. ; Konstanzer, H. ; Damman, M. ; Mikulla, M. ; Poprawe, R. ; Weimann, G.
出版情報:
Test and measurement applications of optoelectronic devices : 21-22 January 2002, San Jose, USA. pp.1-8, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
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