1.

国際会議録
国際会議録
1. Design Improvement of a Bearing Frame Using Structural Analysis Results
Wei,L.
出版情報: Proceedings of the IMAC-XIX : a conference on structural dynamics, February 5-8, 2001, Hyatt Orlando Kissimmee, Florida.  4359  pp.1748-1750,  2001.  Bethel, CT.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4359
2.

国際会議録
国際会議録
2. The Study of Se- and Si-Implanted GaAs by Slow Positrons
Fujii,S. ; Shikata,S. ; Wei,L. ; Tanigawa,S.
出版情報: Positron annihilation : Proceedings of the 9th International Conference on Positron Annihilation, August 26-31, 1991, Szombathely, Hungary.  Pt.3  pp.1387-1390,  1992.  Aederlmannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 105-110
3.

国際会議録
国際会議録
3. Updating Finite Element Model Using Test Data,#256
Wei,L.
出版情報: Proceedings of the 17th International Modal Analysis Conference February 8-11, 1999 Hyatt Orlando Hotel Kissimmee, Florida.  Part1  pp.573-578,  1999.  Bethel, CT.  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3727
4.

国際会議録
国際会議録
4. Traveling-wave single-mode Er-doped fiber laser
Wei,L. ; Lit,J.W.Y.
出版情報: Rare-earth-doped devices II : 26-27 January 1998, San Jose, California.  pp.111-118,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3280
5.

国際会議録
国際会議録
5. A New Method to Compute Sensitivity Matrices of a Mechanical Structure
Wei,L.
出版情報: Proceedings of the IMAC-XVIII: a conference on structural dynamics, February 7-10, 2000, the Westin La Cantera Resort, San Antonio, Texas.  Part1  pp.234-237,  2000.  Bethel, CT.  Society for Experimental Mechanics
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4062
6.

国際会議録
国際会議録
6. The Study of Defects Induced by the Implantation of O Ions into GaAs by a Slow Positron Beam
Fujii,S. ; Wei,L. ; Tanigawa,S.
出版情報: Shallow Impurities in Semiconductors : Proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors "Physics and Control of Impurities", International Conference Center Kobe, Japan, 5 to 8 August, 1992.  pp.411-416,  1993.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 117-118
7.

国際会議録
国際会議録
7. Study of Point Defects in Impurity-Doped ZnSe by a Monoenergetic Positron Beam
Miyajima,T. ; Wei,L. ; Tanigawa,S. ; Okuyama,H. ; Akimoto,K. ; Mori,Y.
出版情報: Positron annihilation : Proceedings of the 9th International Conference on Positron Annihilation, August 26-31, 1991, Szombathely, Hungary.  Pt.3  pp.1423-1426,  1992.  Aederlmannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 105-110
8.

国際会議録
国際会議録
8. Monoenergetic Positron Beam Study of Heavily Si-doped GaAs Grown by MOCVD using Tertiarybutylarsine
Chichibu,S. ; Iwai,A. ; Nakahara,Y. ; Matsumoto,S. ; Higuchi,H. ; Wei,L. ; Tanigawa,S.
出版情報: Shallow Impurities in Semiconductors : Proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors "Physics and Control of Impurities", International Conference Center Kobe, Japan, 5 to 8 August, 1992.  pp.315-320,  1993.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 117-118
9.

国際会議録
国際会議録
9. Characterization of Defects in As-Grown and Electron-Irradiated 3C-SiC Epilayers by Using Slow Positron
Itoh,H. ; Yoshikawa,M. ; Nashiyama,I. ; Wei,L. ; Tanigawa,S. ; Misawa,S. ; Okumura,H. ; Yoshida,S.
出版情報: Shallow Impurities in Semiconductors : Proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors "Physics and Control of Impurities", International Conference Center Kobe, Japan, 5 to 8 August, 1992.  pp.501-506,  1993.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 117-118
10.

国際会議録
国際会議録
10. Origin of the Carrier Reduction by Annealing in n-Type ZnSe
Miyajima,T. ; Okuyama,H. ; Akimoto,K. ; Wei,L. ; Tanigawa,S.
出版情報: Shallow Impurities in Semiconductors : Proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors "Physics and Control of Impurities", International Conference Center Kobe, Japan, 5 to 8 August, 1992.  pp.483-487,  1993.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 117-118