International Workshop on Photonics and Imaging in Biology and Medicine : 8-10 October 2001, Wuhan, China. pp.19-27, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Algorithms, devices, and systems for optical information processing III : 20-21 July 1999, Denver, Colorado. pp.188-193, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Algorithms, devices, and systems for optical information processing III : 20-21 July 1999, Denver, Colorado. pp.215-221, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Propagation and imaging through the atmosphere III : 22-23 July 1999, Denver, Colorado. pp.41-49, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Signal processing, sensor fusion, and target recognition VIII : 5-7 April 1999, Orlando, Florida. pp.467-472, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Polarization: measurement, analysis, and remote sensing II : 19-21 July 1999, Denver, Colorado. pp.197-203, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Advanced sensors and monitors for process industries and the environment : 4-5 November 1998, Boston, Massachusetts. pp.294-302, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Metrology, inspection, and process control for microlithography XIV : 28 February - 2 March 2000, San Clara, California. pp.678-685, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical diagnostic methods for inorganic transmissive materials II : 3-4 August 2000, San Diego, USA. pp.12-18, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Photorefractive fiber and crystal devices : materials, optical properties, and applications VI : 30-31 July 2000, San Diego, USA. pp.139-151, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering