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Coherence domain optical methods and optical coherence tomography in biomedicine X : 23-25 January 2006, San Jose, California, USA. pp.60791J-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Wang, F. ; Reissner, M. ; Fischer, T. ; Grebner, S. ; Schwarz, R.
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Amorphous silicon technology, 1993 : Symposium held April 13-16, San Francisco, California, U.S.A.. pp.491-496, 1993. Pittsburgh, Pa.. Materials Research Society
Brogueira, P. ; Grebner, S. ; Wang, F. ; Schwarz, R. ; Chu, V. ; Conde, J.P.
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Amorphous silicon technology, 1993 : Symposium held April 13-16, San Francisco, California, U.S.A.. pp.121-126, 1993. Pittsburgh, Pa.. Materials Research Society
High-temperature oxidation and corrosion 2005 : proceedings of the International Symposium on High-Temperature Oxidation and Corrosion 2005 , Nara, Japan, 30th November - 2nd December 2005. pp.331-338, 2006. Uetikon-Zuerich, Switzerland. Trans Tech Publications
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Broadband access communication technologies : 2-3 October, 2006, Boston, Massachusetts, USA. pp.63900L-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Biophotonics and immune responses : 23-24 January 2006, San Jose, California, USA. pp.60870N-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Wu, A.Y. ; Wang, F. ; Juang, C-B. ; Bustamante, C.
出版情報:
Ferroelectric thin films : symposium held April 16-20, 1990, San Francisco, California, U.S.A.. pp.261-266, 1990. Pittsburgh, Pa.. Materials Research Society
Weinert, H. ; Petrauskas, M. ; Kolenda, J. ; Galeckas, A. ; Wang, F. ; Schwarz, R.
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Amorphous silicon technology, 1993 : Symposium held April 13-16, San Francisco, California, U.S.A.. pp.497-502, 1993. Pittsburgh, Pa.. Materials Research Society
Complex mediums III : beyond linear isotropic dielectrics : 8-10 July 2002, Seattle, [Washington] USA. pp.258-263, 2002. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering