Proton radiation damage in high-resistivity n-type silicon CCDs | 東京工業大学附属図書館文献データベース

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Proton radiation damage in high-resistivity n-type silicon CCDs

著者名:

Bebek, C.J. ( Lawrence Berkeley National Lab. (USA) )

さらに 7 件

掲載資料名:

Sensors and camera systems for scientific, industrial, and digital photography applications III : 21-23 January, 2002, San Jose, [California], USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4669

発行年:

2002

開始ページ:

161

終了ページ:

171

総ページ数:

11

出版情報:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819444097 [081944409X]

言語:

英語

請求記号:

P63600/4669

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012497
シリーズID:	PA00000029
会議名:	IS&T/SPIE Electronic Imaging : Sensors and camera systems for scientific, industrial, and digital photography applications
回次:	2002 : 3rd
会議開催地:	San Jose, CA, USA
会議開催年:	2002.01.21-2002.01.23

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2 国際会議録 Quantum efficiency of a back-illuminated CCD imager:an optical approach Groom,D.E., Holland,S.E., Levi,M.E., Palaio,N.P., Perlmutter,S., Stover,R.J., Wei,M. SPIE - The International Society for Optical Engineering	8 国際会議録 SNAP focal plane Lampton, M.L., Bebek, C., Akerlof, C.W., Aldering, G., Amanullah, R., Astier, P., Barrelet, E., Bergstroem, L., … SPIE-The International Society for Optical Engineering
3 国際会議録 LBNL four-side buttable CCD package development Oluseyi, H.M., Bercovitz, J.H., Karcher, A., Hernikl, C.D., Miller, T., Uslenghi, M., Roe, N., Bebek, C., Holland, S.E., … SPIE - The International Society of Optical Engineering	9 国際会議録 SNAP near infrared detectors Tarle, G., Akerlof, C.W., Aldering, G., Amanullah, R., Astier, P., Barrelet, E., Bebek, C., Bergstroen, L., Bercovitz, … SPIE-The International Society for Optical Engineering
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