1.

国際会議録
国際会議録
1. Infuence of Hydrostatic Pressure on Deep Levels in Silicon Induced by Annealing
Smid,V. ; Zeman,J. ; Kristorik,J. ; Mares,J.J. ; Vyzhigin,Yu.V. ; Kostylev,V.A. ; Sobolev,N.A. ; Eliseev,V.V. ; Likunova,V.M.
出版情報: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part1  pp.231-236,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 38-41
2.

国際会議録
国際会議録
2. Fast Neutron Transmutation Reactions in Si-A New Way of Introduction of Mg-Related Centers
Sobolev,N.A. ; Emtsev,V.V. ; Gresserov,B.N. ; Klinger,P.M. ; Poloskin,D.S. ; Shabalin,E.P. ; Shek,E.I. ; Vyzhigin,Yu.V.
出版情報: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.129-134,  1994.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 143-147