1.

国際会議録
国際会議録
1. Absolute extreme-ultraviolet metrology
Tarrio,C. ; Vest,R.E. ; Grantham,S.
出版情報: Harnessing light : science and metrology at NIST, 1 August 2001, San Diego, USA.  pp.94-107,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4450
2.

国際会議録
国際会議録
2. NIST programs for calibrations in the far-ultraviolet spectral region
Vest,R.E. ; Canfield,L.R. ; Furst,M.L. ; Graves,R.M. ; Hamilton,A.D. ; Hughey,L.R. ; Lucatorto,T.B. ; Madden,R.P.
出版情報: Ultraviolet atmospheric and space remote sensing : methods and instrumentation II : 22 July 1999, Denver, Colorado.  pp.15-26,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3818
3.

国際会議録
国際会議録
3. AlGaN Schottky diodes for short-wavelength UV applications
Chow,P.P. ; Klaassen,J.J. ; Vest,R.E. ; VanHove,J.M. ; Wowchak,A.M. ; Polley,C.
出版情報: Photodetectors : materials and devices VI : 22-24 January 2001, San Jose, USA.  pp.230-237,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4288