1.

国際会議録
国際会議録
1. Bonding, Defects, and Defect Dynamics in the SiC-SiO2 System
Pantelides, S.T. ; Buczko, R. ; Ventra, M. Di ; Wang, S. ; Kim, S.-G. ; Pennycook, S.J. ; Duscher, G. ; Feldman, L.C. ; McDonald, K. ; Chanana, R.K. ; Weller, R.A. ; Williams, J.R. ; Chung, G.Y. ; Tin, C.C. ; Isaacs-Smith, T.
出版情報: Silicon carbide--materials, processing and devices : symposium held November 27-29, 2000, Boston, Massachusetts, U.S.A..  2001.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 640
2.

国際会議録
国際会議録
2. Atomic-Scale Engineering of the SiC-SiO2 Interface
Pantelides, S. T. ; Duscher, G. ; Ventra, M. Di ; Buczko, R. ; McDonald, K. ; Huang, M. B. ; Weller, R. A. ; Baumvol, I. ; Stedile, F. C. ; Radtke, C. ; Pennycook, S. J. ; Chung, G. ; Tin, C. C. ; Williams, J. R. ; Won, J. ; Feldman, L. C.
出版情報: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.1133-1136,  2000.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 338-342(2)