Compact laser scanning confocal microscope [5858-08]

Compact laser scanning confocal microscope [5858-08]

著者名:

Beghuin, D. ( Lambda-X s.a. (Belgium) )
VandeVen, M.
Ameloot, M. ( Univ. Hasselt (Belgium) )
Claessens, D. ( Verhaert (Belgium) )
Van Oostveldt, P. ( Ghent Univ. (Belgium) )

掲載資料名:

Nano- and Micro-Metrology

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5858

発行年:

2005

開始ページ:

585808

終了ページ:

585808

総ページ数:

1

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819458582 [0819458589]

言語:

英語

請求記号:

P63600/5858

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00015897
シリーズID:	PA00000029
会議名:	Optical Metrology : Nano- and Micro-Metrology
回次:	2005
会議開催地:	Munich, Germany
会議開催年:	2005.06.16-2005.06.17

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