Britte, L. ; Peeters, B. ; Van der Auweraer, H. ; Debille, J. ; O'Grady, M.
出版情報:
Proceedings of the 6th International Symposium on Environmental Testing for Space Programmes : 12-14 June 2007, Noordwijk, The Netherlands. 2007. Noordwijk, The Netherlands. ESA Communication Production Office
Haberstok, C. ; Freymann, R. ; Steinbichler, H. ; Van der Auweraer, H. ; Vanlanduit, S.
出版情報:
Laser metrology and inspection : 14-15 June 1999, Munich, Germany. pp.26-37, 1999. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Proceedings of IMAC-XX : a Conference on Structural Dynamics, February 4-7, 2002, The Westin Los Angeles Airport, Los Angeles, California. Volume II pp.923-929, 2002. Bethel, CT. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Van der Auweraer, H. ; Fischer, M. ; Hendricx, W. ; Pezzutto, A. ; Garesci, F.
出版情報:
Proceedings of IMAC-XX : a Conference on Structural Dynamics, February 4-7, 2002, The Westin Los Angeles Airport, Los Angeles, California. Volume I pp.558-563, 2002. Bethel, CT. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Peeters, B. ; Van der Auweraer, H. ; Guillaume, P.
出版情報:
Proceedings of IMAC-XX : a Conference on Structural Dynamics, February 4-7, 2002, The Westin Los Angeles Airport, Los Angeles, California. Volume II pp.977-983, 2002. Bethel, CT. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Peeters, B. ; Peeters, K. ; Van der Auweraer, H. ; Olbrechts, T. ; Demeester, F. ; Wens, L.
出版情報:
Sixth International Conference on Vibration Measurements by Laser Techniques: Advances and Applications : 22-25 June 2004, Ancona, Italy. pp.298-309, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering