1.

国際会議録
国際会議録
1. Carrier Lifetime Control and Characterization of High-Resistivity Silicon Used for High-Power Devices
Schulze,H.-J. ; Frohnmeyer,A. ; Niedernostheide,F.-J. ; Hille,F. ; Tutto,P. ; Pavelka,T. ; Wachutka,G.
出版情報: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.414-424,  2000.  Pennington, N.J., Bellingham, Wash..  Electrochemical Society — SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4218
2.

国際会議録
国際会議録
2. Charge Carrier Lifetime Modification in Silicon by High Energy H+,He+ Ion Implantation
Khanh,N.Q. ; Tutto,P. ; Jaroli,E.N. ; Buiu,O. ; Biro,L.P. ; Paszti,F. ; Mohacsy,T. ; Kovacsics,C. ; Manuaba,A. ; Gyulai,J.
出版情報: Materials science applications of ion beam techniques : proceedings of the International Symposium on Materials Science Applications of Ion Beam Techniques, incoeporating the 1st German-Australian Workshop on Ion Beam Analysis, Seeheim, Germany, September 9-12 1996.  pp.101-106,  1997.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 248-249
3.

国際会議録
国際会議録
3. Charge Injection and Storage Behaviour of MNOS Structures
Horvath,Zs.J. ; Stubnya,G. ; Tutto,P. ; Nemeth-Sallay,M. ; Balazs,J.
出版情報: Proceedings of the Tenth International Workshop on the Physics of Semiconductor Devices (December 14-18, 1999).  Part1  pp.383-386,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3975