1.

国際会議録
国際会議録
1. Characterization of Ti/Al Ohmic Contacts to p-Type 4H-SiC Using Cathodoluminescence and Auger Electron Spectroscopies
Gao, M. ; Tumakha, S.P. ; Onishi, T. ; Tsukimoto, S. ; Murakami, M. ; Brillson, L.J.
出版情報: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.891-894,  2006.  Stafa-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 527-529
2.

国際会議録
国際会議録
2. Nanoscale Deep Level Defect Correlation with Schottky Barriers in 4H-SiC/Metal Diodes
Tumakha, S.P. ; Porter, L.M. ; Ewing, D.J. ; Wahab, Q. ; Ma, X.Y. ; Sudarshan, T.S. ; Brillson, L.J.
出版情報: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.907-910,  2006.  Stafa-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 527-529
3.

国際会議録
国際会議録
3. A Study of Inhomogeneous Schottky Diodcs on n-Type 4H-SiC
Ewing, D.J. ; Wahab, Q. ; Tumakha, S.P. ; Brillson, L.J. ; Ma, X.Y. ; Sudarshan, T.S. ; Porter, L.M.
出版情報: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.911-914,  2006.  Stafa-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 527-529