Speckle metrology 2003 : 18-20 June 2003, Trondheim, Norway. pp.189-193, 2003. Bellingham, Wash. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Advanced materials and devices for sensing and imaging : 17-18 October 2002, Shanghai, China. pp.195-203, 2002. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Kadono, H. ; Nakamura, T. ; Matsui, K. ; Toyooka, S.
出版情報:
Speckle metrology 2003 : 18-20 June 2003, Trondheim, Norway. pp.355-359, 2003. Bellingham, Wash. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
19th Congress of the International Commission for Optics: Optics for the Quality of Life. pp.988-989, 2003. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering