Doerfel, F. ; Nerreter, S. ; Tomm, J.W. ; Grunwald, R. ; Kunkel, R. ; Luft, J.
出版情報:
Test and measurement applications of optoelectronic devices : 21-22 January 2002, San Jose, USA. pp.48-54, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Koziowska, A. ; Weik, F. ; Tomm, J.W. ; Malqg, A. ; Latoszek, M. ; Wawrzyniak, P. ; Teodorczyk, M. ; Dobrzahski, L. ; Zbroszczyk, M. ; Bugajski, M.
出版情報:
High-power diode laser technology and applications III : 24-25 January, 2005, San Jose, California, USA. pp.158-165, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Hatami, F. ; Schrottke, L. ; Tomm, J.W. ; Talalaev, V. ; Kristukat, C. ; Goni, A.R. ; Masselink, W.T.
出版情報:
Ultrafast Phenomena in Semiconductors and Nanostructure Materials VIII. pp.77-89, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Weik, F. ; Tomm, J.W. ; Glatthaar, R. ; Vetter, U. ; Szewczyk, D. ; Nurnus, J. ; Lambrecht, A. ; Grau, M. ; Meyer, R. ; Amann, M.C. ; Spellenberg, B. ; Bassler, M.
出版情報:
Light-Emitting Diodes: Research, Manufacturing, and Applications VIII. pp.149-157, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering