Beam-solid interactions and transient processes : symposium held December 1-4, 1986, Boston, Massachusetts, U.S.A.. pp.555-560, 1987. Pittsburgh, Pa.. Materials Research Society
Materials issues in silicon integrated circuit processing : symposium held April 15-18, 1986, Palo Alto, California, U.S.A.. pp.125-132, 1986. Pittsburgh, Pa.. Materials Research Society
Im, J. S. ; Chen, C. K. ; Thompson, C. V. ; Geis, M. W. ; Tomita, H.
出版情報:
Silicon-on-insulator and buried metals in semiconductors : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A.. pp.169-174, 1988. Pittsburgh, Pa.. Materials Research Society
Nakamura, T. ; Ikeda, K. ; Tomita, H. ; Komiya, S. ; Nakajima, K.
出版情報:
Advanced interconnects and contact materials and processes for future integrated circuits : symposium held April 13-16, 1998, San Francisco, California, U.S.A.. pp.213-, 1998. Warrendale, Pa.. MRS - Materials Research Society
Eguchi, K. ; Hieda, K. ; Nakahira, J. ; Kiyotoshi, M. ; Nakabayashi, M. ; Yamazaki, S. ; Izuha, M. ; Aoyama, T. ; Tsunoda, K. ; Lin, J. ; Nakamura, K. ; Niwa, S. ; Tomita, H. ; Shimada, A. ; Kohyama, Y. ; Ishibashi, Y. ; Fukuzumi, Y. ; Arikado, T. ; Okumura, K.
出版情報:
Ferroelectric thin films VIII : symposium held November 29-December 2, 1999, Boston, Massachusetts, U.S.A.. pp.3-, 2000. Warrendale, PA. MRS-Materials Research Society
Tomita, H. ; Watanabe, K. ; Kawarabayashi, J. ; Iguchi, T.
出版情報:
Hard X-ray and gamma-ray detector physics V : 4-5 August, 2003, San Diego, California. pp.281-288, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Kobayashi, Y. ; Yoshii, Y. ; Minezaki, T. ; Enya, K. ; Aoki, T. ; Suganuma, M. ; Tomita, H. ; Doi, M. ; Motohara, K. ; Peterson, B.A. ; Smith, C.H. ; Little, J.K. ; Greene, B.
出版情報:
Large Ground-based Telescopes. Part Two pp.954-964, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Vishnu, V. ; Randall, M. ; Pillette, C.J. ; Katayama, K. ; Omura, K. ; Uemura, R. ; Tomita, H. ; Ando, R. ; Ogata, K. ; Maejima, H. ; DiDonato, A. ; Nicholson, J.
出版情報:
Metrology, Inspection, and Process Control for Microlithography XVIII. pp.958-966, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering