1.

国際会議録
国際会議録
1. Limiting factors in the production of deep microstructures
Tolfree,D.W. ; O'Neill,W. ; Tunna,L. ; Sutcliffe,C.
出版情報: Device and process technologies for MEMS and microelectronics : 27-29 October 1999, Royal Pines Resort, Queensland, Australia.  pp.242-252,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3892
2.

国際会議録
国際会議録
2. Review of UK training initiatives for microsystems technology
Tolfree,D.W. ; McCormick,M. ; Chowanietz,E. ; Yates,R.B.
出版情報: Education in microelectronics and MEMS : 28-29 October 1999, Royal Pines Resort, Queensland, Australia.  pp.134-140,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3894