Targets and backgrounds X : characterization and representation : 12-13 April 2004, Orlando, Florida, USA. pp.1-12, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Signal processing, sensor fusion, and target recognition XII : 21-23 April 2003, Oriando, Florida, USA. pp.552-561, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Infrared imaging systems : design, analysis, modeling, and testing XVI : 30 March-1 April 2005, Orlando, Florida, USA. pp.240-251, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Toet, A. ; Kooi, F. L. ; Kuijper, F. ; Smeenk, R. J. M.
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Enhanced and synthetic vision 2005 : 28 March 2005, Orlando, Florida, USA. pp.144-153, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Enhanced and synthetic vision 2003 : 21 April, 2003, Orlando, Florida, USA. pp.168-178, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Sensors, and command, control, communications, and intelligence (C31) technologies for homeland defense and law enforcement II : 21-25 April 2003, Orlando, Florida, USA. pp.372-379, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Enhanced and synthetic vision 2005 : 28 March 2005, Orlando, Florida, USA. pp.37-46, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Targets and backgrounds VIII : characterization and representation : 1-3 April 2002, Orland, USA. pp.118-129, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Hogervorst, M.A. ; Bijl, P. ; Toet, A. ; Valeton, J.M.
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Targets and backgrounds VIII : characterization and representation : 1-3 April 2002, Orland, USA. pp.83-94, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Enhanced and synthetic vision 2003 : 21 April, 2003, Orlando, Florida, USA. pp.58-65, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering