Golovchenko, Jene ; Hwang, Ing-Shouh ; Ganz, Eric ; Theiss, Silva K.
出版情報:
Evolution of surface and thin film microstructure : symposium held November 30-December 4, 1992, Boston, Massachusetts, U.S.A.. pp.79-86, 1993. Pittsburgh, Pa.. Materials Research Society
Golovchenko, Jene ; Hwang, Ing-Shouh ; Ganz, Eric ; Theiss, Silva K.
出版情報:
Atomic-scale imaging of surfaces and interfaces : symposium held November 30-December 2, 1992, Boston, Massachusetts, U.S.A.. pp.41-48, 1993. Pittsburgh, Pa.. Materials Research Society
Materials reliability in microelectronics VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A.. pp.207-, 1996. Pittsburgh, Pa.. MRS - Materials Research Society
Materials reliability in microelectronics VII : symposium held April 8-12, 1997, San Francisco, California, U.S.A.. pp.387-, 1997. Pittsburgh, Pa.. MRS - Materials Research Society
Subramanian, Gopalakrishnan ; Jones, K.S. ; Law, Mark E. ; Caturla, Maria J. ; Theiss, Silva K. ; Rubia, Tomas Diaz de la
出版情報:
Si front-end processing - physics and technology of dopant-defect interactions II : symposium held April 24-27, 2000, San Francisco, California, U.S.A.. pp.B11.6-, 2001. Warrendale, PA. Materials Research Society
Polycrystalline thin films II : structure, properties, and applications : symposium held November 27-December 1, 1995, Boston, Massachusetts, U.S.A.. pp.651-, 1996. Pittsburgh, Pa.. MRS - Materials Research Society
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