1.

国際会議録
国際会議録
1. Portable X-Ray Apparatus for Stress Measurements
Monin, V.I. ; Assis, J.T. ; Pereira, F.R. ; Gurova, T. ; Teodosio, J.R.
出版情報: THERMEC '2003 : International Conference on Processing & Manufacturing of Advanced Materials, July 7-11, 2003, Leganés, Madrid, Spain.  pp.4531-4534,  2003.  Zuerich-Uetikon, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 426-432
2.

国際会議録
国際会議録
2. Relaxation of Residual Stresses during Fatigue Cycles in Steels
Teodosio, J.R. ; Fonseca, M.C. ; Pedrosa, P.D.
出版情報: THERMEC '2003 : International Conference on Processing & Manufacturing of Advanced Materials, July 7-11, 2003, Leganés, Madrid, Spain.  pp.3981-3988,  2003.  Zuerich-Uetikon, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 426-432
3.

国際会議録
国際会議録
3. X-ray analysis of stress distribution in ferrite and austenite of duplex steel during tensile loading
Monin, V.I. ; de Assis, J.T. ; Filippov, S.A. ; Gurova, T. ; Teodosio, J.R. ; Abreu, H.F.
出版情報: Seventh International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering : 9-15 June 2003, St. Petersburg, Russia.  pp.209-211,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5400
4.

国際会議録
国際会議録
4. Portable x-ray apparatus for stress measurements
Monin, V.I. ; de Assis, J.T. ; Pereira, F.R. ; Filippov, S.A. ; Gurova, T. ; Teodosio, J.R. ; Abreu, H.F.
出版情報: Seventh International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering : 9-15 June 2003, St. Petersburg, Russia.  pp.192-195,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5400
5.

国際会議録
国際会議録
5. Computer simulation of line profile and data processing in diffraction experiments]225
Gurova, T. ; Teodosio, J.R. ; Assis, J.T. ; Monin, V.I. ; Titovets, Y.F.
出版情報: Fifth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering.  pp.225-229,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4627