High-resolution extended NIR camera
- 著者名:
Cabelli, S.A. ( Rockwell Scientific Co. (USA) ) Pan, J. ( Rockwell Scientific Co. (USA) ) Bernd, S.G. ( Rockwell Scientific Co. (USA) ) Tennant, W.E. ( Rockwell Scientific Co. (USA) ) Blackwell, J.D. ( Rockwell Scientific Co. (USA) ) Bhargava, S. ( Rockwell Scientific Co. (USA) ) Pasko, J.G. ( Rockwell Scientific Co. (USA) ) Piquette, E.C. ( Rockwell Scientific Co. (USA) ) Edwall, D.D. ( Rockwell Scientific Co. (USA) ) - 掲載資料名:
- Infrared technology and applications XXIX : 21-25 April 2003, Orlando, Florida, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5074
- 発行年:
- 2003
- 開始ページ:
- 343
- 終了ページ:
- 352
- 総ページ数:
- 10
- 出版情報:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819449337 [0819449334]
- 言語:
- 英語
- 請求記号:
- P63600/5074
- 資料種別:
- 国際会議録
類似資料:
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |