1.

国際会議録
国際会議録
1. Section IV:Slow Beam and Surfaces The Study of the Thin Magnetic Film Fe and Multilayer Fe/Hf with the Slow Positron Beam
Koizumi,T. ; Iwamoto,A. ; Ohtaki,H. ; Murashige,Y. ; Tashiro,M. ; Kanazawa,I. ; Komori,F. ; Ito,Y.
出版情報: Positron annihilation, ICPA-11 : Proceedings of the 11th International Conference on Positron Annihilation, Kansas City, Missouri, USA, May 1997.  pp.626-628,  1997.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 255-257
2.

国際会議録
国際会議録
2. The Positron-Induced Ion-Desorption Spectroscopy
Kanazawa,I. ; Koizumi,T. ; Iwamoto,A. ; Tashiro,M. ; Komori,F. ; Murata,Y. ; Fukutani,K. ; Ito,Y.
出版情報: Positron annihilation, ICPA-11 : Proceedings of the 11th International Conference on Positron Annihilation, Kansas City, Missouri, USA, May 1997.  pp.787-789,  1997.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 255-257
3.

国際会議録
国際会議録
3. Fabrication of the ASTRO-E hard-x-ray detector
Nakazawa,K. ; Kamae,T. ; Makishima,K. ; Takahashi,T. ; Murakami,T. ; Tashiro,M. ; Fukazawa,Y. ; Tamura,T. ; Iyomoto,N. ; Ebisawa,K. ; Ezoe,Y. ; Hamaya,M. ; Horii,M. ; Isobe,N. ; Kotoku,J. ; Kubota,A. ; Matsumoto,Y. ; Mizuno,T. ; Mizuno,Y.
出版情報: EUV, x-ray, and gamma-ray instrumentation for astronomy X : 21-23 July 1999 Denver, Colorado.  pp.148-159,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3765
4.

国際会議録
国際会議録
4. Development of the large-area silicon PIN diode with 2-millimeter-thick depletion layer for hard x-ray detector (HXD) on board Astro-E
Sugizaki,M. ; Kubo,S. ; Murakami,T. ; Ota,N. ; Ozawa,H. ; Takahashi,T. ; Kaneda,H. ; Iyomoto,N. ; Kamae,T. ; Kokubun,M. ; Kubota,A. ; Makishima,K. ; Tamura,T. ; Tashiro,M. ; Koyama,K. ; Tsunemi,H.
出版情報: Hard X-ray and gamma-ray detector physics, optics, and applications : 31 July-1 August 1997, San Diego, California.  pp.244-253,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3115