1.

国際会議録
国際会議録
1. Spatially Resolved Diagnostic in Multicrystalline Silicon for Solar Cells Using Room Temperature Photoluminescence Spectroscopy
Tarasov,I. ; Ostapenko,S. ; Haessler,C. ; Raisner,E.-U.
出版情報: Analytical and diagnostic techniques for semiconductor materials, devices and processes : joint proceedings of the symposia on ALTECH 99, satellite symposium to ESSDERC 99, Leuven, Belgium [and] the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices.  pp.433-440,  1999.  Pennington, N.J..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3895
2.

国際会議録
国際会議録
2. Resonance Ultrasonic Diagnostics of As-Grown and Process-Induced Defects in Cz Silicon
Belyaev,A. ; Tarasov,I. ; Ostapenko,S. ; Koveshnikov,S. ; Kochelap,V.A. ; Beyaev,A.E.
出版情報: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.660-669,  2000.  Pennington, N.J., Bellingham, Wash..  Electrochemical Society — SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4218