Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part2 pp.1149-1154, 1997. Zurich, Switzerland. Trans Tech Publications
Smart materials, structures, and integrated systems : 11-13 December 1997, Adelaide, Australia. pp.429-435, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997. Part2 pp.1205-1208, 1998. Zuerich, Switzerland. Trans Tech Publications