Tajima, M. ; Higashi, E. ; Hayashi, T. ; Kinoshita, H. ; Shiomi, H.
出版情報:
Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005. pp.711-716, 2006. Stafa-Zuerich. Trans Tech Publications
Goto, T. K. ; Tajima, M. ; Harada, F. ; Kato, T. ; Yamazaki, T. ; Taguchi, T.
出版情報:
Data analysis and modeling for process control II : 3-4 March, 2005, San Jose, California, USA. pp.18-28, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Materials characterization : symposium held April 15-17, 1986, Palo Alto California, U.S.A.. pp.251-256, 1986. Pittsburgh, Pa.. Materials Research Society
Uchida, K. ; Kohama, Y. ; Tajima, M. ; Soga, T. ; Jimbo, T. ; Umeno, M.
出版情報:
Heteroepitaxy on silicon : fundamentals, structure, and devices : symposium held April 5-8, 1988, Reno, Nevada, U.S.A.. pp.319-324, 1988. Pittsburgh, Pa.. Materials Research Society
Iwabuchi, T. ; Ishikawa, Y. ; Inafuku, H. ; Takahashi, K. ; Hirose, K. ; Tajima, M. ; Adachi, M. ; Kudoh, M.
出版情報:
Proceedings of the Sixth European Space Power Conference (ESPC) : 6-10 May 2002, Porto, Portugal. pp.635-640, 2002. Noordwijk. ESA Publications Division
Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology. pp.815-828, 2002. Pennington, NJ. Electrochemical Society
Hagimoto, V. ; Fujita, T. ; Ono, K. ; Fujioka, H. ; Oshima, M. ; Hirose, K. ; Tajima, M.
出版情報:
Silicon nitride and silicon dioxide thin insulating films, proceedings of the fifth International Symposium. pp.134-142, 1999. Pennington, New Jersey. Electrochemical Society
Izumi, J. ; Yasutake, A. ; Tomonaga, N. ; Oka, N. ; Ota, H. ; Akutsu, N. ; Umeda, S. ; Tajima, M.
出版情報:
Progress in zeolite and microporous materials : proceedings of the 11th International Zeolite Conference, Seoul, Korea, August 12-17, 1996. C pp.2315-, 1997. Amsterdam. Elsevier
Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah. pp.322-328, 2003. Pennington, NJ. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Silicon-on-insulator technology and devices XI : proceedings of the international symposium. pp.413-424, 2003. Pennington, N.J.. Electrochemical Society
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