1.

国際会議録
国際会議録
1. Distinction of the Nuclei of Shockley Faults in 4H-SiC{0001} pin Diodes by Electroluminescence Imaging
R. Ishii ; T. Miyanagi ; I. Kamata ; H. Tsuchida ; K. Nakayama ; Y. Sugawara
出版情報: Silicon carbide and related materials 2006 : ECSCRM 2006, Proceedings of the 6th European Conference on Silicon Carbide and Related Materials, Newcastle upon Tyne, UK, September 2006.  pp.251-254,  2007.  Stafa-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 556-557
2.

国際会議録
国際会議録
2. Migration of Dislocations in 4H-SiC Epilayers during the Ion Implantation Process
H. Tsuchida ; I. Kamata ; M. Nagano ; L. Storasta ; T. Miyanagi
出版情報: Silicon carbide and related materials 2006 : ECSCRM 2006, Proceedings of the 6th European Conference on Silicon Carbide and Related Materials, Newcastle upon Tyne, UK, September 2006.  pp.271-274,  2007.  Stafa-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 556-557