1.

国際会議録
国際会議録
1. Dislocation in 4H n+ SiC Substrates and their Relationship with Epilayer Defects
P. Wu ; E. Emorhokpor ; M. Yoganathan ; T. Kerr ; J. Zhang ; E. Romano ; I. Zwieback
出版情報: Silicon carbide and related materials 2006 : ECSCRM 2006, Proceedings of the 6th European Conference on Silicon Carbide and Related Materials, Newcastle upon Tyne, UK, September 2006.  pp.247-250,  2007.  Stafa-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 556-557
2.

国際会議録
国際会議録
2. A mammography imaging hybrid pixel sensor test chip with low-noise CMOS readout IC on fully depleted silicon-on-insulator design
D. Nguyen ; H. Cormican ; A. Baysal ; C. Wiswall ; T. Kerr
出版情報: Penetrating radiation systems and applications IX : 13-14 August 2008, San Diego, California, USA.  pp.708009-1-708009-11,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 7080