Computational imaging III : 17-18 January 2005, San Jose, California, USA. pp.328-335, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Color imaging X : processing, hardcopy, and applications : 17-20 January 2005, San Jose, California, USA. pp.53-64, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Semiconductor and Organic Optoelectronic Materials and Devices. pp.591-595, 2000. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Sun, Y. ; Ning, Y. ; Jin, Z. ; Qin, L. ; Yan, C. ; Wang, C. ; Liu, Y. ; Tao, G. ; Chu, G. ; Liu, J. ; Wang, L.
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Semiconductor and Organic Optoelectronic Materials and Devices. pp.585-590, 2000. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Advanced materials and devices for sensing and imaging II : 8-10 November 2004, Beijing, China. pp.351-355, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Algorithms for synthetic aperture radar imagery XII : 28-31 March, 2005, Orlando, Florida, USA. pp.282-293, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering