1.

国際会議録
国際会議録
1. EVALUATION OF SEMICONDUCTOR LATTICE DAMAGE USING A NEWLY-DEVELOPED PHOTODISPLACEMENT LASER PROBE
Sumie, S. ; Takamatsu, H. ; Tsunaki, H. ; Nishimoto, Y. ; Nakai, Y.
出版情報: Photons and low energy particles in surface processing : symposium held Decmber[i.e. December] 3-6, 1991, Boston, Massachusetts, U.S.A..  pp.241-246,  1992.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 236
2.

国際会議録
国際会議録
2. Excess Carrier Lifetime Mapping for Bulk SiC Wafers by Microwave Photoconductivity Decay Method and Its Relationship with Structural Defect Distribution
Kato, M. ; Ichimura, M. ; Arai, E. ; Sumie, S. ; Hashizume, H.
出版情報: Silicon carbide and related materials 2003 : ICSCRM, 2003 : proceedings of the 10th International Conference on Silicon Carbide and Related Materials 2003, Lyon, France, October 5-10, 2003.  pp.505-508,  2004.  Uetikon-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 457-460