1.

国際会議録
国際会議録
1. Scanning Electrochemical Microscopy of Defects in Thin Aluminum Oxide Films
Serebrennikova, I. ; White, H. ; Wall, D. ; Missert, N. ; Sullivan, J.P. ; Barbour, J.C.
出版情報: Oxide Films : proceedings of the International Symposium.  pp.139-148,  2000.  Pennington, N.J..  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 2000-4
2.

国際会議録
国際会議録
2. Material properties of piezoceramics at elevated temperatures
Gnanamanickam, E.P. ; Sullivan, J.P. ; Shelley, W.F., II
出版情報: Smart structures and materials 2004 : active materials : behavior and mechanics : 15-18 March 2004, San Diego, California, USA.  pp.421-431,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5387
3.

国際会議録
国際会議録
3. Electronic Defects and Interface Potentials for Al Oxide Films on Al and Their Relationship to Electrochemical Properties
Sullivan, J.P. ; Dunn, R.G. ; Barbour, J.C. ; Wall, F.D. ; Missert, N. ; Buchheil, R.G.
出版情報: Oxide Films : proceedings of the International Symposium.  pp.24-35,  2000.  Pennington, N.J..  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 2000-4
4.

国際会議録
国際会議録
4. The Influence of Nanoengineered Cu Defects on Alumninum Pitting Initiation
Wall, F.D. ; Son, K.-A. ; Missert, N.A. ; Barbour, J. ; Martinez, M.A. ; Zavadil, K.R. ; Sullivan, J.P. ; Copeland, R.G. ; Cieslak, W.R. ; Buchheit, R. ; Isaacs, H.
出版情報: Proceedings of the Symposium on Critical Factors in Localized Corrosion III : a symposium in honor of the 70th birthday of Jerome Kruger.  pp.701-712,  1998.  Pennington, New Jersey.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 98-17
5.

国際会議録
国際会議録
5. THE FABRICATION OF NiSi2/Si(100) INTERFACES WITH CONTROLLED MORPHOLOGIES
Sullivan, J.P. ; Tung, R.T. ; Schrey, F. ; Graham, W.R.
出版情報: Semiconductor heterostructures for photonic and electronic applications : symposium held November 30-December 4, 1992, Boston, Massachusetts, U.S.A..  pp.623-628,  1993.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 281
6.

国際会議録
国際会議録
6. GROWTH OF SINGLE CRYSTAL Si/NiSi2/Si(100) AND SiCoSi2/Si(100) STRUCTURES BY MOLECULAR BEAM EPITAXY AND FURNACE ANNEALING
Tung, R.T. ; Eaglesham, D.J. ; Schrey, F. ; Sullivan, J.P.
出版情報: Semiconductor heterostructures for photonic and electronic applications : symposium held November 30-December 4, 1992, Boston, Massachusetts, U.S.A..  pp.641-646,  1993.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 281
7.

国際会議録
国際会議録
7. Wet Oxidation of AlGaAs: Arsenic Barriers on the Road to MIS
Ashby, C.I.H. ; Sullivan, J.P. ; Newcomer, P.P. ; Missert, N.A. ; Hou, H.Q. ; Hammons, B.E. ; Baca, A.G.
出版情報: Proceedings of the twenty-sixth State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XXVI).  pp.58-65,  1997.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 97-1
8.

国際会議録
国際会議録
8. The Electrical Properties of Native and Deposited Thin Aluminum Oxide Layers on Aluminum: Hydration Effects
Sullivan, J.P. ; Barbour, J.C. ; Dunn, R.G. ; Son, K.-A. ; Montes, L.P. ; Missert, N. ; Copeland, R.G.
出版情報: Proceedings of the Symposium on Critical Factors in Localized Corrosion III : a symposium in honor of the 70th birthday of Jerome Kruger.  pp.111-117,  1998.  Pennington, New Jersey.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 98-17
9.

国際会議録
国際会議録
9. A COMBINATORIAL APPROACH TO DETERMINE MECHANISMS OF ATMOSPHERIC COPPER SULFIDATION
Barbour, J.C. ; Sullivan, J.P. ; Braithwaite, I.W. ; Missert, N ; Nelson, J.S. ; Dunn, R.G. ; Minor, K.G. ; Copeland, G. ; Lucero, S.
出版情報: Corrosion and reliability of electronic materials and devices : proceedings of the fourth international symposium.  pp.67-74,  1999.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 99-29
10.

国際会議録
国際会議録
10. CREVICE CORROSION INITIATION AT ENGINEERED Cu-RICH DEFECTS IN Al THIN FILMS
Missert, N. ; Son, K.A. ; Wall, F.D. ; Barbour, J.C. ; Sullivan, J.P. ; Zavadil, K.R. ; Copeland, R.G. ; Martinez, M.A. ; Buchheit, R.G. ; Jeffcoate, C.S. ; Isaacs, H.S.
出版情報: Corrosion and reliability of electronic materials and devices : proceedings of the fourth international symposium.  pp.36-44,  1999.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 99-29