1.

国際会議録
国際会議録
1. Design and test of a differential scanning stage system for a x-ray nanoprobe instrument (Invited Paper) [5877-14]
Shu, D. ; Maser, J. ; Halt, M. ; Lai, B. ; Vogt. S. ; Wang, Y. ; Preissner, C. ; Han, Y. ; B. Tieman, ; Winarski, R. ; Smalyanitskiy, A ; Stephenson, G. B.
出版情報: Optomechanics 2005 : 3-4 August 2005, San Diego, California, USA.  pp.58770E-,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5877
2.

国際会議録
国際会議録
2. IN-SITU TIME-RESOLVED X-RAY STUDIES OF EUTECTIC CRYSTALLIZATION IN AMORPHOUS Fe1-XBx AND Co1-xZrx
Fischer, Henry E. ; Brauer, S. ; Sutton, M. ; Strom-Olsen, J. ; Zaluska, A. ; Stephenson, G. B. ; Koster, Uwe
出版情報: Interface dynamics and growth : symposium held December 2-6, 1991, Boston, Massachusetts, U.S.A..  pp.159-164,  1992.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 237
3.

国際会議録
国際会議録
3. In Situ Analysis of the Formation of Thin TiSi2 (<50 nm) Contacts in Submicron CMOS Structures During Rapid Thermal Annealing
Clevenger, L. A. ; Cabral, C., Jr ; Roy, R. A. ; Lavoie, C. ; Viswanathan, R. ; Saenger, K. L. ; Jordan-Sweet, J. ; Morales, G. ; Ludwig, K. L., Jr ; Stephenson, G. B.
出版情報: Silicide thin films - fabrication, properties, and applications : Symposium held November 27-30, 1995, Boston, Massachusetts, USA.  pp.257-,  1996.  Pittsburgh.  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 402
4.

国際会議録
国際会議録
4. IN-SITU X-RAY DIFFRACTION AND RESISTIVITY ANALYSIS OF CoSi2 PHASE FORMATION WITH AND WITHOUT A Ti INTERLAYER AT RAPID THERMAL ANNEALING RATES
Cabral, C., Jr. ; Clevenger, L. A. ; Stephenson, G. B. ; Brauer, S. ; Morales, G. ; Ludwig, K. F., Jr.
出版情報: Applications of synchrotron radiation techniques to materials science II : symposium held November 27-December 2, 1994, Boston, Massachusetts, USA.  pp.253-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 375
5.

国際会議録
国際会議録
5. HIGH-RESOLUTION X-RAY DIFFRACTION MEASUREMENTS OF SiGe/Si STRUCTURES
Jordan-Sweet, J. L. ; Mooney, P. M. ; Stephenson, G. B.
出版情報: Applications of synchrotron radiation techniques to materials science II : symposium held November 27-December 2, 1994, Boston, Massachusetts, USA.  pp.201-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 375
6.

国際会議録
国際会議録
6. X-RAY SPECTROSCOPIC STUDIES OF ORGANO-METALLIC VAPOR PHASE EPITAXIAL GROWTH
Brennan, S. ; Fuoss, P. H. ; Kisker, D. W. ; Lamelas, F. J. ; Imperatori, P. ; Stephenson, G. B.
出版情報: Common themes and mechanisms of epitaxial growth : symposium held April 13-15, 1993, San Francisco, California, U.S.A..  pp.165-,  1993.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 312