1.

国際会議録
国際会議録
1. Long Distance Point Defect Migration in Irradiated SiC Observed by Deep Level Transient Spectroscopy
Alfieri, G. ; Grossner, U. ; Monakhov, E.V. ; Svensson, B.G. ; Steeds, J.W. ; Sullivan, W.
出版情報: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.485-488,  2006.  Stafa-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 527-529
2.

国際会議録
国際会議録
2. High Energy Local Vibrational Modes of Carbon Aggregates in SiC: Experimental and Theoretical Insight
Mattausch, A ; Bockstedte, M. ; Pankratov, O. ; Steeds, J.W. ; Furkert, S.A. ; Hayes, J.M. ; Sullivan, W. ; Wright, N.G.
出版情報: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.465-468,  2006.  Stafa-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 527-529
3.

国際会議録
国際会議録
3. Investigation of the Displacement Threshold of Si in 4H SiC
Sullivan, W. ; Steeds, J.W.
出版情報: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.481-484,  2006.  Stafa-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 527-529
4.

国際会議録
国際会議録
4. Origin of the Up-Conversion Process in 4H SiC
Steeds, J.W. ; Furkert, S.A. ; Sullivan, W. ; Wagner, G.
出版情報: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.473-476,  2006.  Stafa-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 527-529
5.

国際会議録
国際会議録
5. CATHODOLUMINESCENCE STUDIES OF STACKING FAULTS IN A QUANTUM WELL STRUCTURE
Bailey, S.J. ; Steeds, J.W.
出版情報: Characterization of the structure and chemistry of defects in materials : symposium held November 28-December 3, 1988, Boston, Massachusetts, U.S.A..  pp.503-508,  1989.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 138
6.

国際会議録
国際会議録
6. TEM STUDY OF DEFECTS IN CdTe/CdMnTe SUPERLATTICES ON (100) InSb
Diamond, S.J. ; Steeds, J.W. ; Ashenford, D. ; Lunn, B.
出版情報: Properties of II-VI semiconductors : bulk crystals, epitaxial films, quantum well structures, and dilute magnetic systems : symposium held November 27-December 2, 1989, Boston, Massachusetts, U.S.A..  pp.437-442,  1990.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 161
7.

国際会議録
国際会議録
7. Microstructural Characterization Of Sintered Ba(Mg_1/3Ta2/3)O3 Materials By Transmission Electron Microscopy And Convergent Beam Electron Diffraction
Steeds, J.W. ; Lin, I-N.
出版情報: Perovskite materials : symposium held April 1-5, 2002, San Francisco, California, U.S.A..  pp.219-224,  2002.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 718
8.

国際会議録
国際会議録
8. Micro-Raman and Photoluminescence Study on n-type 6H-SiC
Feng, Z.C. ; Chua, S.J. ; Evans, A.G. ; Steeds, J.W. ; Williams, K.P.J. ; Pitt, G.D.
出版情報: Silicon carbide and related materials : ECSCRM2000, proceedings of the 3rd European Conference on Silicon Carbide and Related Materials, Kloster Banz, Germany, September 2000.  pp.345-348,  2001.  Uetikon-Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 353-356
9.

国際会議録
国際会議録
9. Differentiation between C and Si Related Damage Centres in 4H- and 6H-SiC by the Use of 90-300 kV Electron Irradiation Followed by Low Temperature Photoluminescence Microscopy
Steeds, J.W. ; Carosella, F. ; Evans, A.G. ; Ismail, M.M. ; Danks, L. R. ; Voegeli, W.
出版情報: Silicon carbide and related materials : ECSCRM2000, proceedings of the 3rd European Conference on Silicon Carbide and Related Materials, Kloster Banz, Germany, September 2000.  pp.381-384,  2001.  Uetikon-Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 353-356
10.

国際会議録
国際会議録
10. Low Temperature Annealing of Optical Centres in 4H SiC
Steeds, J.W. ; Furkert, S. ; Hayes, J.M. ; Sullivan, W.
出版情報: Silicon carbide and related materials 2003 : ICSCRM, 2003 : proceedings of the 10th International Conference on Silicon Carbide and Related Materials 2003, Lyon, France, October 5-10, 2003.  pp.637-640,  2004.  Uetikon-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 457-460