Environmentally conscious manufacturing III : 29-30 October, 2003, Providence, Rhode Island, USA. pp.1-5, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Srivastava, R. ; Shenoy, G. ; Forrest, S. ; Chinnayelka, S. ; Besser, R.S. ; McShane, M.J.
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Biomedical nanotechnology architectures and applications : 20-24 January 2002, San Jose, USA. pp.411-420, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Madupu, A. ; Mazumdar, A. ; Zhang, J. ; Roelant, D. ; Srivastava, R.
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Computational imaging III : 17-18 January 2005, San Jose, California, USA. pp.36-46, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Recent advances in the science and technology of zeolites and related materials : proceedings of the 14th International Zeolite Conference, Cape Town, South Africa, 25-30th April 2004. pp.2703-2710, 2004. Amsterdam. Elsevier
Piwihski, M. ; Dziczek, D. ; Srivastava, R. ; Chwirot, S.
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Atomic and molecular physics : Fifth Workshop on Atomic and Molecular Physics : 16-18 September, 2004, Jurata, Poland. pp.206-209, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Recent advances in the science and technology of zeolites and related materials : proceedings of the 14th International Zeolite Conference, Cape Town, South Africa, 25-30th April 2004. pp.978-984, 2004. Amsterdam. Elsevier
Characterization of porous solids VI : proceedings of the 6th International Symposium on the Characterization of Porous Solids (COPS-VI), Alicante, Spain, May 8-11, 2002. pp.553-560, 2002. Amsterdam. Elsevier
Piwinski, M. ; Dziczek, D. ; Srivastava, R. ; Gradziel, M. ; Chwirot, S.
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IV Workshop on Atomic and Molecular Physics : 19-21 September 2002, Jurata, Poland. pp.132-135, 2003. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering