Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.. pp.237-242, 1985. Pittsburgh, Pa.. Materials Research Society
Pinheiro, M. V. B. ; Rauls, E. ; Gerstmann, U. ; Greulich-Weber, S. ; Spaeth, J. M.
出版情報:
Silicon carbide and related materials 2004 : ECSCRM 2004 : proceedings of the 5th European Conference on Silicon Carbide and Related Materials, August 31 - September 4 2004, Bologna, Italy. pp.477-480, 2005. Uetikon-Zuerich. Trans Tech Publications
Rauls, E. ; Gerstmann, U. ; Pinheiro, M. V. B. ; Greulich-Weber, S. ; Spaeth, J. M.
出版情報:
Silicon carbide and related materials 2004 : ECSCRM 2004 : proceedings of the 5th European Conference on Silicon Carbide and Related Materials, August 31 - September 4 2004, Bologna, Italy. pp.465-468, 2005. Uetikon-Zuerich. Trans Tech Publications
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