1.

国際会議録
国際会議録
1. RELAXATION DEFECT CHARACTERIZATION OF RTCVD Si1-XGeX/Si HETEROSTRUCTURES BY ELECTRICAL AND OPTICAL TECHNIQUES
Souifi, A. ; Bremond, G. ; Benyattou, T. ; Guillot, G. ; Dutartre, D.
出版情報: Defect engineering in semiconductor growth, processing and device technology : symposium held April 26-May 1, 1992, San Francisco, California, U.S.A..  pp.247-252,  1992.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 262
2.

国際会議録
国際会議録
2. Growth by low pressure chemical vapor deposition of silicon quantum dots on insulator for nanoelectronics devices
Baron, T. ; Martin, F. ; Mur, P. ; Wyon, C. ; Dupuy, M. ; Bussert, C. ; Souifi, A. ; Guillot, G.
出版情報: Semiconductor quantum dots : symposium held April 5-8, 1999, San Francisco, California, U.S.A..  pp.37-,  2000.  Warrendale, PA.  MRS-Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 571
3.

国際会議録
国際会議録
3. Influence of Semi-Insulating Substrate Purity on the Output Characteristics of 4H-SiC MESFETs
Sghaier, N. ; Bluet, J.M. ; Souifi, A. ; Guillot, G. ; Morvan, E. ; Brylinski, C.
出版情報: Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001.  pp.1363-1366,  2002.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 389-393
4.

国際会議録
国際会議録
4. Optical Properties of Self-organised SSMBE and GSMBE Ge Nanostructures Grown on SiGe Template Layers on Si (118)
Bremond, G. ; Ferrandis, P. ; Souifi, A. ; Ronda, A. ; Berbezier, I.
出版情報: Growth, evolution and properties of surfaces, thin films and self-organized structures : symposium held November 27-December 1, 2000, Boston, Massachusetts, U.S.A..  2001.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 648
5.

国際会議録
国際会議録
5. Kinetic Analysis and Correlation With Residual Stress of the Ni/Si System in Thin Film
Cacho, F. ; Aime, D. ; Wacquant, F. ; Froment, B. ; Rivero, C. ; Gergaud, P. ; Thomas, O. ; Cailletaud, G. ; Jaouen, H. ; Minoret, S. ; Souifi, A.
出版情報: Thin films : stresses and mechanical properties XI : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A..  pp.429-436,  2005.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 875
6.

国際会議録
国際会議録
6. Oxidation of Si/nc-Ge/Si Heterostructures for Non Volatile Memory Applications
Kanoun, M. ; Souifi, A. ; Decossas, S. ; Dubois, C. ; Bremond, G. ; Bassani, F. ; Lim, Y. ; Ronda, A. ; Berbezier, I. ; Kermarrec, O. ; Bensahel, D.
出版情報: Unconventional approaches to nanostructures with applications in electronics, photonics, information storage and sensing : symposium held April 21-25, 2003, San Francisco, California, U.S.A..  pp.253-258,  2003.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 776
7.

国際会議録
国際会議録
7. Optical and electrical characteristics of LEDs fabricated from Si-nanocrystals. embedded in SiO2
Garrido, B. ; Gonzalez, O. ; Cheylan, S. ; Lopez, M. ; Perez-Rodriguez, A. ; Garcia, C. ; Pellegrino, P. ; Ferrer, R. ; Morante, J. R. ; De La Torre, J. ; Souifi, A. ; Poncet, A. ; Busseret, C. ; Lemiti, M. ; Bremond, G. ; Guillot, G.
出版情報: Towards the first silicon laser.  pp.45-54,  2003.  Dordrecht.  Kluwer Academic Publishers
シリーズ名: NATO science series. Series 2, Mathematics, physics and chemistry
シリーズ巻号: 93
8.

国際会議録
国際会議録
8. Spectroscopic Investigation of Vanadium Acceptor Level in 4H and 6H-SiC
Lauer, V. ; Bremond, G. ; Souifi, A. ; Guillot, G. ; Chourou, K. ; Madar, R. ; Clerjaud, B.
出版情報: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.635-638,  2000.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 338-342(1)
9.

国際会議録
国際会議録
9. Influence of Semi-Insulating Substrate Purity on the Output Characteristics of 4H-SiC MESFETs
Sghaier, N. ; Bluet, J.M. ; Souifi, A. ; Guillot, G. ; Morvan, E. ; Brylinski, C.
出版情報: Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001.  pp.1363-1366,  2002.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 389-393
10.

国際会議録
国際会議録
10. Effect of Heavy Doping on the Photoluminescence and Photoreflectance Spectra of Silicon and SiGe Layers
Bru-Chevallier, C. ; Trui, B. ; Souifi, A. ; Bremond, G. ; Guillot, G. ; Chroboczek, J. A.
出版情報: Diagnostic techniques for semiconductor materials processing II : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A..  pp.295-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 406