1.

国際会議録
国際会議録
1. Simulation of transient temperature profiles during ELA and relation to process parameters
Kisdarjono,H. ; Voutsas,T. ; Solanki,R. ; Kumar,A.
出版情報: Flat panel display technology and display metrology II : 22-23 January 2001, San Jose, [California] USA.  pp.41-45,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4295
2.

国際会議録
国際会議録
2. Characteristics of excimer-laser-annealed polysilicon films for application in polysilicon thin film transistor devices
Voutsas,T. ; Marmorstein,A. ; Solanki,R.
出版情報: Active matrix liquid crystal displays technology and applications : 10-11 February, 1997, San Jose, California.  pp.112-118,  1997.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3014