A new approach to prioritizing anomalies found during thermographic electrical inspections

A new approach to prioritizing anomalies found during thermographic electrical inspections

著者名:

Snell, J.R. Jr., ( Snell Infrared (USA) )
Spring, R.W. ( Snell Infrared (USA) )

掲載資料名:

Thermosense XXV, 22-24 April, 2003, Orlando, Florida, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5073

発行年:

2003

開始ページ:

222

終了ページ:

230

総ページ数:

9

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819449320 [0819449326]

言語:

英語

請求記号:

P63600/5073

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013061
シリーズID:	PA00000029
会議名:	Defense, Security, and Sensing : Thermosense
回次:	2003 : 25th
会議開催地:	Orlando, FL, USA
会議開催年:	2003.04.22-2003.04.24

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