Vanhellemont, J. ; Janssens, K. G. F. ; Frabboni, S. ; Smeys, P. ; Balboni, R. ; Armigliato, A.
出版情報:
Diagnostic techniques for semiconductor materials processing II : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A.. pp.479-, 1996. Pittsburgh, Pa.. MRS - Materials Research Society
Yang, I.Y. ; Fung, S. ; Sleight, J. ; Narasimha, S. ; Zamdmer, N. ; Smeys, P. ; Welser, J. ; Agnello, P. ; Leobandung, E. ; Shahidi, G.
出版情報:
Semiconductor wafer bonding : science, technology, and applications : proceedings of the international symposia. pp.177-196, 2001. Pennington, NJ. Electrochemical Society
Vanhellemont, J. ; Janssens, K. G. F. ; Frabboni, S. ; Smeys, P. ; Balboni, R. ; Armigliato, A.
出版情報:
Surface/interface and stress effects in electronic material nanostructures : symposium held November 27-December 1, 1995, Boston, Massachusetts, U.S.A.. pp.435-, 1996. Pittsburgh, Pa.. MRS - Materials Research Society