Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995. pp.1431-1436, 1995. Zurich, Switzerland. Trans Tech Publications
Technologies for synthetic environments : hardware-in-the-loop testing : 9-11 April 1996, Orlando, Florida. pp.366-375, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering