1.

国際会議録
国際会議録
1. Effect of the dispersion of the reflection-induced retardance upon the sensitivity of an optical current sensor
Wang, Z. P. ; Li, Q. B. ; Qi, Y. ; Huang, Z. J. ; Shi, J. H.
出版情報: Advanced sensor systems and applications II : 8-12 November 2004, Beijing, China.  pp.466-473,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5634
2.

国際会議録
国際会議録
2. Theoretical analysis of effects of linear birefringence inside sensing head upon bulk glass current sensors' performance
Wang, Z. P. ; Li, Q. B. ; Liu, X. Y. ; Wang, F. ; Huang, Z. J. ; Shi, J. H.
出版情報: Advanced sensor systems and applications II : 8-12 November 2004, Beijing, China.  pp.481-488,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5634
3.

国際会議録
国際会議録
3. Wavelength dependence of the sensitivity of a bulk-glass optical current transformer
Wang, Z. P. ; Li, Q. B. ; Qi, Y. ; Huang, Z. J. ; Shi, J. H.
出版情報: Advanced sensor systems and applications II : 8-12 November 2004, Beijing, China.  pp.756-765,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5634
4.

国際会議録
国際会議録
4. Method to enhance the accuracy of the retardance measurement of quarter-wave plates
Wang, Z. P. ; Li, Q. B. ; Tan, Q. ; Huang, Z. J. ; Shi, J. H.
出版情報: Optical design and testing II : 8-12 November 2004, Beijing, China.  pp.169-176,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5638
5.

国際会議録
国際会議録
5. Measurement of the linear birefringence inside bulk glass current sensing elements with a retarder
Wang, Z. P. ; Li, Q. B. ; Ouyang, C. M. ; Huang, Z. J. ; Shi, J. H.
出版情報: Optical design and testing II : 8-12 November 2004, Beijing, China.  pp.185-192,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5638