Targets and backgrounds IX: Characterization and representation : 21-22 April 2003, Oriando, Florida, USA. pp.293-299, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Tang, K. ; Kristl, J.A. ; Tibaudo, C. ; Schroeder, J.W. ; Kurosu, T.P. ; Sharpe, S.W. ; Johnson, T.J. ; Sams, R.L.
出版情報:
Targets and backgrounds VIII : characterization and representation : 1-3 April 2002, Orland, USA. pp.184-190, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
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