Characterisation of GaAs/AlGaAs heterostructures grown by OMVPE using trimethylamine alane as a new alu-minum source
- 著者名:
Hobson,W.S. McAfee,S.R. Jones,K.S. Paroskevopoulos,N.C. Abernathy,C.R. Sputz,S.K. Harris,T.D. Schnoes,M.Lamont Pearton,S.J. - 掲載資料名:
- Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991
- シリーズ名:
- Materials science forum
- シリーズ巻号:
- 83-87
- 発行年:
- 1992
- 巻:
- Pt.2
- 開始ページ:
- 1063
- 終了ページ:
- 1068
- 出版情報:
- Zurich, Switzerland: Trans Tech Publications
- ISSN:
- 02555476
- ISBN:
- 9780878496280 [0878496289]
- 言語:
- 英語
- 請求記号:
- M23650
- 資料種別:
- 国際会議録
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