1.

国際会議録
国際会議録
1. Three-dimensional superresolution imaging of single molecules by spectrally selective confocal microscopy
Brakenhoff,G.J. ; Oijen,A.M.van ; Kohler,J. ; Muller,M. ; Schmidt,J.
出版情報: Proceedings of three-dimensional and multidimensional microscopy : image acquisition and processing VI : 24-25 January 1999, San Jose, California.  pp.82-89,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3605
2.

国際会議録
国際会議録
2. ODMR and electron spin echo studies on the non-radiative triplet state of the(V-O)0 defect in silicon
Frens,A.M. ; Schmidt,J. ; Chen,W.M. ; Monemar,B.
出版情報: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.1  pp.357-362,  1992.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 83-87
3.

国際会議録
国際会議録
3. Two-wavelength interferometry combined with N-point technique
Schmidt,J.
出版情報: Interferometry '99 : techniques and technologies : 20-23 September 1999, Pułtusk, Poland.  pp.200-206,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3744
4.

国際会議録
国際会議録
4. The Dynamics of the Non-Radiative Triplet State of the(V-O)｡?Defect in Silicon:Evidence for a Radical Pair Mechanism
Frens,A.M. ; Braat,M.E. ; Oosten,A.B.van ; Schmidt,J.
出版情報: Shallow Impurities in Semiconductors : Proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors "Physics and Control of Impurities", International Conference Center Kobe, Japan, 5 to 8 August, 1992.  pp.195-200,  1993.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 117-118
5.

国際会議録
国際会議録
5. High-frequency EPR studies of shallow and deep boron acceptors in 6H-SiC.(Invited)
Schmidt,J. ; Matsumoto,T. ; Poluektov,O.G. ; Arnold,A. ; Ikoma,T. ; Baranov,P.G. ; Mokhov,E.N.
出版情報: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.703-708,  1997.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 258-263
6.

国際会議録
国際会議録
6. High-Frequency EPR Studies of Shallow and Deep Boron Acceptors in 6H-SiC
Schmidt,J. ; Matsumoto,T.M. ; Poiuektov,O.G. ; Duijn-Arnold,A.van ; Ikoma,T. ; Baranov,P.G. ; Mokhov,E.N.
出版情報: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part1  pp.587-590,  1998.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 264-268
7.

国際会議録
国際会議録
7. The Configurational Change of a Metastable S-Cu Defect in Silicon
Chen,W.M. ; Janzen,E. ; Monemar,B. ; Henry,A. ; Frens,A.M. ; Bennebroek,M.T. ; Schmidt,J.
出版情報: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.2  pp.1179-1184,  1994.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 143-147
8.

国際会議録
国際会議録
8. Strong Electron Correlation in Si:OV and Si:V - an ab Initio Cluster Study-
Oosten,A.B.van ; Frens,A.M. ; Schmidt,J.
出版情報: Shallow Impurities in Semiconductors : Proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors "Physics and Control of Impurities", International Conference Center Kobe, Japan, 5 to 8 August, 1992.  pp.87-92,  1993.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 117-118
9.

国際会議録
国際会議録
9. Generic worklist handler for workflow-enabled products
Schmidt,J. ; Meetz,K. ; Wendler,Th.
出版情報: Medical imaging 1999, PACS design and evaluation : engineering and clinical issues : 23-25 February 1999, San Diego, California.  pp.288-298,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3662
10.

国際会議録
国際会議録
10. Observation of Rapid Direct Charge Transfer between Deep Defects in Silicon
Frens,A.M. ; Bennebroek,M.T. ; Zakrzewski,A. ; Schmidt,J. ; Chen,W.M. ; Janzen,E. ; Lindstrom,J.L. ; Monemar,B.
出版情報: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.3  pp.1371-1374,  1994.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 143-147