Three-dimensional image capture and applications III : 24-25 January 2000, San Jose, California. pp.260-269, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Automated optical inspection for industry : 6-7 November 1996, Beijing, China. pp.444-452, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Intelligent robots and computer vision XVIII : Algorithms, techniques, and active vision : 20-21 September 1999, Boston, Massachusetts. pp.334-344, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Machine vision applications in industrial inspection VII : 25-26 January 1999, San Jose, California. pp.21-27, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical diagnostics of living cells III : 24-25 January 2000, San Jose, California. pp.270-279, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Metrology, Inspection, and Process Control for Microlithography X. pp.194-205, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering