1.

国際会議録
国際会議録
1. Background host effects on the nonlinear photophysical properties of a two-photon absorbing organic dye [5989-25]
Pikas, D. J. ; Walker, M. A. ; Brewer, C. D. ; Sankaran, B. ; Tan, L. S. ; Kuzyk, M. G. ; Kirkpatrick, S. M. ; Powers, P. E.
出版情報: Technologies for optical countermeasures II ; Femtosecond phenomena II ; and, Passive millimetre-wave and terahertz imaging II : 26-28 September 2005, Bruges, Belgium.  pp.59890P-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5989
2.

国際会議録
国際会議録
2. Photophysics of organic materials exhibiting strong two-photon and excited state absorption (Invited Paper)
Sutherland, R.L. ; Brant, M.C. ; McLean, D.G. ; Rogers, J.E. ; Sankaran, B. ; Kirkpatrick, S.M. ; Fleitz, P.A.
出版情報: Nonlinear Optical Transmission and Multiphoton Processes in Organics II.  pp.79-85,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5516
3.

国際会議録
国際会議録
3. Fabrication of cantilever probes with integrated piezoresistive read-out and built-in piezoelectric actuators
Olson, S. ; Altemus, B. ; Sankaran, B. ; Tokranova, N. ; Geer, R. ; Castracane, J. ; Xu, B.
出版情報: MEMS/MOEMS Components and Their Applications II.  pp.167-174,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5717
4.

国際会議録
国際会議録
4. Integrated cantilever fabrication and system development for ultrasonic and acoustic scanning probe microscopy
Olson, S. ; Sankaran, B. ; Altemus, B. ; Xu, B. ; Geer, R.
出版情報: Testing, Reliability, and Application of Micro- and Nano-Material Systems III.  pp.159-167,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5766
5.

国際会議録
国際会議録
5. Nondestructive mechanical imaging of carbon nanotubes
Zheng, Y. ; Sankaran, B. ; Geer, R.
出版情報: Testing, Reliability, and Application of Micro- and Nano-Material Systems III.  pp.99-105,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5766