1.

国際会議録
国際会議録
1. High-precision 2D angle measurement using fringe analysis techniques
Ge,Z. ; Saito,T. ; Matsuda,S. ; Takeda,M.
出版情報: Optical manufacturing and testing IV : 31 July-2 August 2001, San Diego, USA.  pp.448-457,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4451
2.

国際会議録
国際会議録
2. Measurement of total integrated scatter of optical coatings for 157-nm lithography
Saito,T. ; Saito,J. ; Nakamura,E. ; Kudo,T. ; Kagaya,M. ; Takahashi,T.
出版情報: Optical metrology roadmap for the semiconductor, optical, and data storage industries II : 2-3 August 2001 San Diego, USA.  pp.22-29,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4449
3.

国際会議録
国際会議録
3. Line-narrowed ArF excimer laser for 193-nm lithography
Saito,T. ; Mitsuhashi,K. ; Arai,M. ; Seki,K. ; Tada,A. ; Igarashi,T. ; Hotta,K.
出版情報: Optical microlithography XII : 17-19 March 1999, Santa Clara, California.  Part2  pp.1069-1075,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3679
4.

国際会議録
国際会議録
4. Numerical analysis of enhanced backscattering from random fractal media
Uozumi,J. ; Saito,T.
出版情報: Optical engineering for sensing and nanotechnology (ICOSN '99) : 16-18 June 1999, Yokohama, Japan.  pp.557-560,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3740
5.

国際会議録
国際会議録
5. ArF excimer-laser exposure durability of chromium-fluoride-attenuated phase-shift masks
Seki,Y. ; Ushioda,J. ; Saito,T. ; Maeda,K. ; Nakano,K. ; Iwasa,S. ; Ohfuji,T. ; Tanabe,H.
出版情報: Photomask and X-ray mask technology IV : 17-18 April, 1997, Kawasaki, Japan.  pp.286-293,  1997.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3096
6.

国際会議録
国際会議録
6. Development of smart systems for building structures
Otani,S. ; Hiraishi,H. ; Midorikawa,M. ; Teshigawara,M. ; Fujitani,H. ; Saito,T.
出版情報: Smart structures and materials 2000 : smart systems for bridges, structures, and highways : 6-7 March 2000, Newport Beach, California.  pp.2-9,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3988
7.

国際会議録
国際会議録
7. Acquisition of 3D image representation in multimedia ambiance communication using 3D laser scanner and digital camera
Kanamaru,T. ; Yamada,K. ; Ichikawa,T. ; Naemura,T. ; Aizawa,K. ; Saito,T.
出版情報: Three-dimensional image capture and applications III : 24-25 January 2000, San Jose, California.  pp.80-89,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3958
8.

国際会議録
国際会議録
8. Fluorescence microscopic system for detection of microorganisms and organic compounds on Mars
Saito,T. ; Kawasaki,Y. ; Kaneko,T. ; Kobayashi,K. ; Miyakawa,A.
出版情報: Instruments, methods, and missions for astrobiology II : 20-22 July 1999, Denver, Colorado.  pp.24-32,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3755
9.

国際会議録
国際会議録
9. High-repetition-rate ArF excimer laser for 193-nm lithography
Kakizaki,K. ; Saito,T. ; Mitsuhashi,K. ; Arai,M. ; Tada,A. ; Kasahara,S. ; Igarashi,T. ; Hotta,K.
出版情報: Optical microlithography XIII : 1-3 March 2000, Santa Clara, USA.  Part2  pp.1397-1404,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4000
10.

国際会議録
国際会議録
10. Structure analysis of natural scenes using census transform and region competition
Yamada,K. ; Ichikawa,T. ; Naemura,T. ; Aizawa,K. ; Saito,T.
出版情報: Visual communications and image processing 2001 : 24-26 January, 2001, San Jose, USA.  pp.228-237,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4310