1.

国際会議録
国際会議録
1. Process Induced Modification of the High Frequency Dielectric Behavior of (100) Textured BaxSr1-xTiO3 (x = 0.5 and 0.6) Thin Films
Majumder, S.B. ; Jain, M. ; Martinez, A. ; Katiyar, R.S. ; Fachini, E.R. ; Keuls, F.W. Van ; Miranda, F.A. ; Sahoo, P.K. ; Kulkarni, V.N.
出版情報: Ferroelectric Thin Films X : symposium held November 25-29, 2001, Boston, Massachusetts, U.S.A..  pp.205-210,  2002.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 688
2.

国際会議録
国際会議録
2. Surface and Interface Characterization of Ion Beam Re-Crystallized Si
Sahoo, P.K. ; Satpati, B. ; Dey, S. ; Satyam, P.V. ; Som, T. ; Kulkarni, V.N.
出版情報: Surface engineering 2002 - synthesis, characterization and applications : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A..  pp.579-584,  2003.  Warrendale, Penn.  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 750
3.

国際会議録
国際会議録
3. Pulsed Laser Deposited Nanocrystalline ZnO Thin Films
Thareja, R.K. ; Mitra, A. ; Ganesan, V. ; Gupta, A. ; Sahoo, P.K. ; Kulkarni, V.N.
出版情報: Growth, evolution and properties of surfaces, thin films and self-organized structures : symposium held November 27-December 1, 2000, Boston, Massachusetts, U.S.A..  2001.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 648
4.

国際会議録
国際会議録
4. Annealing Behaviour of WSix Films Prepared By CVD
Katiyar, M. ; Samal, G.S. ; Gupta, R.K. ; Deepak ; Sahoo, P.K. ; Kulkarn, V.N. ; Adetutu, O.
出版情報: Gate stack and silicide issues in silicon processing II : symposium held April 17-19, 2001, San Francisco, California, U.S.A..  2002.  Warrendale, PA.  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 670