1.

テクニカルペーパー
テクニカルペーパー
1. A Straightening Strategy for the Automobile Industries
Saha,S.K. ; Kumar,A. ; Kar,I.N. ; Jha,R. ; Momaya,K. ; Bhalla,M. ; Gupta,H.
出版情報: 2nd International SAEINDIA Mobility Conference, proceedings : technology directions for clean, safe and efficient vehicles : Indian Institute of Technology, IIT PO, Chennai, January 10-12, 2002.  pp.393-398,  2002.  Warrendale, PA.  Society of Automotive Engineering, Inc.
シリーズ名: SAE publication
シリーズ巻号: P-376
2.

国際会議録
国際会議録
2. Estimation of quantum mechanical and polysilicon depletion effects for ultrathin silicon dioxide gate dielectric
Srinivasan,G. ; Saha,S.K. ; Rezvani,G.A.
出版情報: Microelectronic Device Technology III.  pp.168-174,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3881
3.

国際会議録
国際会議録
3. Temperature dependence of electroluminescence in tris-(8-hydroxy) quinoline aluminum (Alq3) light-emitting diode
Saha,S.K. ; Su,Y.K. ; Juang,F.S.
出版情報: Light-Emitting Diodes: Research, Manufacturing, and Applications V.  pp.173-179,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4278
4.

国際会議録
国際会議録
4. Systematic methodology for optimizing the trade-off of polysilicon depletion versus boron penetration in sub-0.18-ｦﾌm surface-channel PMOS devices
Scott,G.S. ; Saha,S.K. ; Olsen,C.S. ; Nouri,F. ; Lutze,J. ; Rubin,M.E. ; Manley,M.
出版情報: Microelectronic Device Technology III.  pp.129-137,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3881
5.

国際会議録
国際会議録
5. Drain profile engineering for MOSFET devices with channel lengths below 100 nm
Saha,S.K.
出版情報: Microelectronic Device Technology III.  pp.195-204,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3881