1.

国際会議録
国際会議録
1. New Insights in Hf Based High-k Gate Deiclectrics in MOSFETs
M. Li ; C. Zhu ; C. Shen ; X. Yu ; Y. Feng ; Y. Yeo ; A. Chin ; D. Kwong ; S. H. Wang ; A. Du ; G. Samudra
出版情報: Physics and technology of high-k gate dielectrics III.  pp.717-732,  2006.  Pennington, N.J..  Electrochemical Society
シリーズ名: ECS transactions
シリーズ巻号: 1(5)
2.

国際会議録
国際会議録
2. Hydrothermal synthesis of a series of indium phosphates in fluoride-amine-H₂O system
C. Chen ; Y. L. Liu ; M. H. Bi ; S. H. Wang ; W. Q. Pang
出版情報: From zeolites to porous MOF materials--the 40th anniversary of International Zeolite Conference : proceedings of the 15th International Zeolite Conference, Beijing, P.R. China, 12-17th August 2007.  170-1  pp.371-376,  2007.  Amsterdam.  Elsevier
シリーズ名: Studies in surface science and catalysis
シリーズ巻号: 170-1
3.

国際会議録
国際会議録
3. Effects of the Defects at HfOxNy/Si Interface on Electrical and Reliability Charucteristics of MOS Devices
K. Chang-Liao ; C. L. Cheng ; C. Y. Lu ; C. H. Huang ; S. H. Wang ; T. K. Wang
出版情報: Physics and technology of high-k gate dielectrics III.  pp.399-406,  2006.  Pennington, N.J..  Electrochemical Society
シリーズ名: ECS transactions
シリーズ巻号: 1(5)
4.

国際会議録
国際会議録
4. Development of a metrological atomic force microscope for nano-scale standards calibration
S. H. Wang ; G. Xu ; S. L. Tan
出版情報: Ninth International Symposium on Laser Metrology.  1  pp.71550I-1-71550I-8,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 7155
5.

国際会議録
国際会議録
5. Efficiency improvement of flexible phosphorescent organic light emitting diode by inserting a buffer layer
Y. S. Tsai ; S. H. Wang ; F. S. Juang ; S. Y. Su ; M. H. Chang
出版情報: Organic photonic materials and devices X : 22-24 January 2008, San Jose, California, USA.  pp.68911A-1-68911A-6,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6891
6.

国際会議録
国際会議録
6. Nondestructive evaluation of MEMS components by optical methods
C. J. Tay ; C. Quan ; S. H. Wang
出版情報: ICEM 2008 : International Conference on Experimental Mechanics 2008, 8-11 November 2008, Nanjing, China , editors ; Xiaoyuan He, Huimin Xie, Yilan Kang ; organized by the Chinese Society for Experimental Mechanics [and] Southeast University (China) ; sponsored by Asian Committee of Experimental Mechanics [and] the Chinese Society of Theoretical and Applied Mechanics ; cosponsored by Ministry of Education of China ... [et al.] ; cooperating organization, SPIE..  1  pp.73752X-1-73752X-6,  2009.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 7375