1.

国際会議録
国際会議録
1. Approaches to Reduced-Defect Active Regions for III-N Devices
J. Culbertson ; C. R. Eddy ; M. Masiro ; N. Bassim ; M. Twigg ; R. Henry ; R. Hoim ; O. Glembocki ; J. D. Caidwell ; P. Neudeck ; A. Trunek ; J. Powell ; M. Peckerar ; Y. Ngu ; F. Yan ; S. Babu
出版情報: State-of-the-art program on compound semiconductors 45 (SOTAPOCS 45) and wide bandgap semiconductor materials and devices 7.  pp.117-126,  2006.  Pennington, N.J.  Electrochemical Society
シリーズ名: ECS transactions
シリーズ巻号: 3(5)
2.

国際会議録
国際会議録
2. MEMS microshutter arrays for James Webb Space Telescope
M. J. Li ; T. Adachi ; C. Allen ; S. Babu ; S. Bajikar ; M. Beamesderfer ; R. Bradley ; K. Denis ; N. Costen ; A. Ewin ; D. Franz ; L. Hess ; R. Hu ; K. Jackson ; M. Jhabvala ; D. Kelly ; T. King ; G. Kletetschka ; A. Kutyrev ; B. Lynch ; T. Miller ; H. Moseley, Jr. ; V. Mikula ; B. Mott ; L. Oh ; J. Pontius ; D. Rapchun ; C. Ray ; E. Schulte ; S. Schwinger ; P. Shu ; R. Silverberg ; W. Smith ; S. Snodgrass ; D. Sohl ; L. Sparr ; R. Steptoe-Jackson ; V. Veronica ; L. Wang ; Y. Zheng ; C. Zincke
出版情報: Micro- and nanotechnology : materials, processes, packaging, and systems III : 11-13 December 2006, Adelaide, Australia.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6415
3.

国際会議録
国際会議録
3. Static and Localized Strain Analysis of High Hardened Linear Model Mock-Up Bearing for Fast Breeder Reactor
S. Babu ; K. Manisekar
出版情報: Advanced Materials and Manufacturing Processes for Strategic Sectors : Selected, peer reviewed papers from the International Conference on Advanced Materials and Manufacturing Processes for Strategic Sectors (ICAMPS 2015), May 13-15, 2015, Trivandrum, India.  pp.223-226,  2015.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 830-831
4.

国際会議録
国際会議録
4. Study of Inhibition Characteristics of Slurry Additives in Copper CMP Using Force Spectroscopy
M. K. Keswani ; H. Lee ; S. Babu ; U. Patri ; Y. Hong ; L. Economikos ; M. Goldstein ; L. Borucki ; A. Philipossian ; Y. Zhuang
出版情報: Silicon materials science and technology X.  pp.515-522,  2006.  Pennington, N.J..  Electrochemical Society
シリーズ名: ECS transactions
シリーズ巻号: 2(2)
5.

国際会議録
国際会議録
5. Room temperature semiconductor detectors for hard x-ray astrophysics
A.M. Parsons ; C.M. Stahle ; C.M. Lisse ; S. Babu ; N. Gehrels
出版情報: Gamma-ray detector physics and applications : 29 July 1994, San Diego, California.  pp.121-132,  1994.  Bellingham, WA.  Society of Photo-optical Instrumentation Engineers
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 2305
6.

国際会議録
国際会議録
6. Linear-mode single photon counting APD arrays with subnanosecond, afterpulse-free performance for ladar, spectroscopy, and QKD applications
L. Aina ; A. Fathimulla ; H. Hier ; M. Lecates ; R. Dwarkin ; D. Johnson ; S. Babu ; J. Foshee
出版情報: Enabling photonics technologies for defense, security, and aerospace applications III : 9-10 April 2007, Orlando, Florida, USA.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6572
7.

国際会議録
国際会議録
7. Complex MEMS device: microshutter array system for space applications
M. J. Li ; T. Adachi ; C. Allen ; S. Babu ; S. Bajikar ; M. Beamesderfer ; R. Bradley ; K. Denis ; N. Costen ; A. Ewin ; D. Franz ; L. Hess ; R. Hu ; K. Jackson ; M. Jhabvala ; D. Kelly ; T. King ; G. Kletetschka ; A. Kutyrev ; B. Lynch ; T. Miller ; H. Moseley ; V. Mikula ; B. Mott ; L. Oh ; J. Pontius ; D. Rapchun ; C. Ray ; K. Ray ; E. Schulte ; S. Schwinger ; P. Shu ; R. Silverberg ; W. Smith ; S. Snodgrass ; D. Sohl ; L. Sparr ; R. Steptoe-Jackson ; V. Valeriano ; L. Wang ; Y. Zheng ; C. Zincke
出版情報: Micro(MEMS) and nanotechnologies for defense and security : 10-12 April 2007, Orlando, Florida, USA.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6556