Scanning probe techniques for materials characterization at nanometer scale : proceedings of the International Symposium. pp.94-101, 2000. Pennington, N.J.. Electrochemical Society
Isaacs, H.S. ; Zhu, Y. ; Sabatani, R. ; Ryan, M.P.
出版情報:
Proceedings of the Symposium on Critical Factors in Localized Corrosion III : a symposium in honor of the 70th birthday of Jerome Kruger. pp.376-382, 1998. Pennington, New Jersey. Electrochemical Society
Muthukrishnan, K. ; Hebert, K.R. ; Ryan, M.P. ; Crouch, D.S. ; Virtanen, S. ; Sch, P. ; Suter, nutz; T. ; Yamada, M. ; Sakairi, M ; Takaliashi, H. ; Nagarni, K. ; Uchi, Ii. ; Strehblow, H-H.
出版情報:
Critical factors in localized corrosion IV : a symposium in honor of the 65th birthday of Hans Böhni : proceedings of the international symposium. pp.56-65, 2002. Pennington, N.J.. Electrochemical Society
Mackay, J.R. ; Hendy, S. ; Laycock, N.J ; Ryan, M.P. ; Toney., M.F. ; Oblonsky, L.J.
出版情報:
Critical factors in localized corrosion IV : a symposium in honor of the 65th birthday of Hans Böhni : proceedings of the international symposium. pp.284-294, 2002. Pennington, N.J.. Electrochemical Society